You are presented with multiple paper abstracts, alongside the associated literature review and chapter titles. Given the provided information, you are going to do a literature review. Please generate a coherent literature review that synthesizes the content, draws connections between different works, highlights major findings, and identifies any gaps in the existing research.

Literature Review Title: Reduction of Power Consumption in FPGAs - An Overview 
Chapter Title:  Leakage and Static Power Reduction 
1. Abstract of Cited Paper (BIB001):  FPGAs are being increasingly used in a wide variety of applications. While power optimization has been only of secondary importance in many FPGA applications, growing importance of leakage in FPGAs designed in 90nm and below makes it imperative to treat power optimization as a first class citizen. In this paper, we propose a leakage-saving technique for FPGAs that involves dividing the FPGA fabric into small regions and switching on/off the power supply to each region using a sleep transistor in order to conserve leakage energy. Specifically, the regions not used by the placed design are supply gated. Next, we present a new placement strategy to increase the number of regions that can be supply gated. Finally, the supply gating technique is extended to exploit idleness in different parts of the same design during different time periods. Our experiments with different region sizes using various commercial and academic designs indicate that the proposed optimization outperforms conventional placement, and reduces leakage power consumption significantly. 
2. Abstract of Cited Paper (BIB002):  In this paper we evaluate the trade-offs between various low-leakage design techniques for field programmable gate arrays (FGPAs) in deep sub-micron technologies. Since multiplexers are widely used in FPGAs for implementing look up tables (LUTs) and connection and routing switches, several low-leakage implementations of pass transistor based multiplexers and routing switches are proposed and their design trade-offs are presented based on transistor-level simulation, physical design, and impact on overall system performance. We find that gate biasing, the use of redundant SRAM cells, and integration of multi-Vt technology are ideal for FPGAs, and they can reduce leakage current by 2X-4X compared to an implementation without any leakage reduction technique. For some of the potential low-leakage design techniques being evaluated in our study, the impact on chip area is very minimal to an increase of 15%-30%. 
3. Abstract of Cited Paper (BIB003):  Reconfigurable computing is well suited for wireless applications because of its capability to adapt to changing communication protocols. However, as technology scales, FPGAs could suffer from leakage energy consumption due to the large number of inactive transistors. This paper presents different buffered switches mixing low and high threshold transistors which trade some delay performance to reduce by two orders of magnitude the leakage current of the switch blocks which generate most of the dissipation in FPGAs.

Literature Review:
Vendors such as Altera and Xilinx incorporate various low-power device-level technologies in their latest FPGA devices. Traditional FPGAs and ASICs only used two oxide thicknesses (dual oxide): a thin oxide for core transistors and a thick oxide for I/O transistors. Moving toward high-performance 90 nm FPGAs, Xilinx integrated circuit (IC) designers started to adopt the use of a thirdgate oxide thickness (triple oxide) of midox in the transistors of the 90 nm Virtex™-4 FPGAs that allows a dramatic reduction in overall leakage, and hence static power, compared to other competitive FPGAs. Virtex-5 FPGAs continue to deploy the triple oxide technology in the 65 nm process node to enable a significant lower leakage current, about 38% lower than what the industry expects for a 65 nm device. At the device level, Altera and Xilinx both utilize triple gate oxide technology, which provides a choice of three different gate thicknesses, to trade-off between performance and static power [38]  . In earlier technologies, only two thicknesses were available. Transistors with thicker oxide were used for the large, higher voltage tolerant transistors in the I/O blocks and the thinner ones were used everywhere else. The new medium thickness oxide transistors provide slightly less performance than thin oxide transistors, but leak significantly less power. These are used in the configuration memory and the switches that are controlled by this memory in the latest FPGAs. The oxide thickness does not affect the performance of the corresponding switches because the configuration memory remains static during the operation of the device. Two recent papers focused on optimizing leakage in the unused portion of an FPGA. Calhoun proposed the creation of fine-grained -sleep regions", making it possible for a logic block's unused LUTs and flip-flops to be put to sleep independently BIB001 . A more coarse-grained sleep strategy was proposed in BIB002 , which partitioned an FPGA into entire regions of logic blocks, such that each region can be put to sleep independently. The authors restricted the placement of the implemented design to fall within a minimal number of the pre-specified regions, and studied the effect of the placement restrictions on design performance. One of few papers to address leakage in FPGA interconnect is BIB003 , which applied well-known leakage reduction techniques to interconnect multiplexers. Four different techniques were studied. First, extra configuration SRAM cells were introduced to allow for multiple OFF transistors on unselected multiplexer paths. The intent is to take advantage of the -stack effect", as illustrated in Figure 9 (a). The left side of Figure 9 (a) shows a typical routing switch multiplexer. Observe that there is a single OFF transistor on the unselected multiplexer path (highlighted). The right side of Figure  9 (a) shows the redundant SRAM cell approach. The unselected path contains two OFF transistors, which limits sub threshold leakage along the path. A second approach described in BIB003 is to layout portion of the multiplexer in separate wells, allowing body-bias techniques to be used to raise the VTH of multiplexer transistors that are not part of the selected signal path [see Figure 9 (b)]. Third, BIB003 proposes negatively biasing the gate terminals of OFF multiplexer transistors [ Figure 9 (c)]. The negative gate bias leads to a significant drop in sub threshold leakage. Finally, BIB003 proposes using dual-VTH techniques, wherein a subset of multiplexer transistors are assigned high-VTH (slow/low leakage), and the remainder of transistors are assigned low-VTH (fast/leaky). The dual-VTH idea, shown in Figure 9 (d), impacts FPGA router complexity, as the router must assign delay-critical signals to low-VTH multiplexer paths. A more recent paper by Ciccarelli applies dual-VTH techniques to the routing switch buffers in addition to the multiplexers BIB004 . a) Redundant SRAM Cell Figure 9 : Multiplexer leakage reduction techniques In the following sub sections some of technologies which have been used to reduce the leakage power in FPGA are discussed