In case of the dynamic memories the only aspect is the device is able to properly store the information. Nowadays, according to standard a dynamic memory - working in normal temperature - have to be refreshed in every 64 milisecond. If this operation doesn’t happen within the proper time defined by standard, the data from some of the memory cells are lost and this phenomenon can result incorrect function of the system.
The ability of the memory cells which defines how long the device can store the data correctly can be different. During the lifetime of the electronic device there are weaker cells, which wear out sooner than the others and they cannot store the data correctly. The refresh time is calculated to these weaker cells.
In order to discover the these weak cells in the memory - without waiting for years that the cells can reveal their errors during the use of the device - modifying the value of the refresh time can be a solution. Thanks to this testing method we get information about which cells have higher probability to cause memory error.
In connection with memory retention the Department of Measurement and Information Systems have created a test system, meanwhile some possibilities have arisen to develop this project. In my degree thesis I focus on this system, I introduce the steps of my work and the different problems I had to face during the semester.