Photoelectron spectroscopy surface analysis and angular distributionsAuthor(s): Andrew Jason
Due to insufficient control over their numerous degrees of freedom, parametric polynomial surfaces designed to satisfy certain interpolator or border constraints may exhibit additional undesirable features. The methods used now to identify and correct such unanticipated surface characteristics are archaic and insufficient. In order to identify such aberrant surface features, this article discusses numerous surface analysis tools. Among them are common methods like contouring and high-resolution shaded image displays based on direct ray tracing, as well as some cutting-edge techniques like maps of the principal curvatures, the integration of curvature lines to show the variation of the principal directions, and the determination of geodesic paths on the surface. Very low angles of incidence are discovered to have impacts from x-ray refraction and reflection, and these cause an increase of about four times. In relative intensities between surface layers. Numerous additions to the theory are also taken into account, including the effects of non-uniform x-ray flux, a more accurate spectrometer acceptance function, the non-uniformity of surface layers, and surface roughness. Numerical calculations are also provided for the particular case of a sinusoidal rough surface. It is shown that, as long as both surfaces are spotless and there is no x-ray shadowing, rough-surface intensities and flat-surface intensities are equivalent. However, it is projected that rough-surface angular distributions will diverge significantly from flat-surface distributions if surface layers are present.