General purpose X-ray diffractometers is able to solve a wide range of powder diffraction tasks. Independent control of detector and sample rotation enables to use the instrument for some analysis of single crystals.
Methods of X-ray diffraction analysis implemented in diffractometers are as follows:
- qualitative and quantitative analysis of phase (mineral) composition of crystalline materials including analysis at changing of environmental conditions (temperature, atmospheric pressure (vacuum), gas medium composition);
- determination of single-crystal orientation;
- analysis of texture and stress state of polycrystalline objects;
- determination of various structural features of crystalline materials including atomic structure research.
X-ray diffractometer DRON-7M is able to solve a wide range of powder diffraction tasks. Independent rotation around axes. DRON-7M model is free from radiation safety inspection and from special requirements for installation and personnel.
General purpose X-ray diffractometer DRON-8 with vertical theta - theta goniometer and sample horizontal position enables to perform X-ray diffraction analysis of phase composition, structural state and orientation of heavy large-size and irregular-form samples.