To understand why a material has certain properties, we analyse its microstructure. Through our microscopes we can look at the shape and size of the grains, phase composition and presence of defects. We have two very advanced electron microscopes (TESCAN LYRA3 and JEOL JSM7001F). In addition, we also have a number of optical microscopes.
One of our microscopes is a dual-beam electron microscope (FIB/SEM) capable of 2D and 3D imaging and analysis. The system is equipped with a universal vacuum system, which makes it easy to analyse any kind of material, including metallic and nonconductive materials. Add-on detectors/systems have been chosen specifically for in-depth studies in the field of materials science and metallurgy.
Hardware (EDAX package):
Our second electron microscope is a high performance thermal field emission scanning electron microscope (FESEM). Add-on detectors/systems have been chosen specifically for in-depth studies in the field of materials science and metallurgy.
Content updated 2017-08-15